A new model for electric force microscopy and its application for electrostatically generated phase difference in tapping mode AFM
Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2005. === Includes bibliographical references (leaf 37). === The harmonic force balance method was used to model and simulate electric force microscopy (EFM) and electrostatically generated phase differ...
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| Format: | Others |
| Language: | English |
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Massachusetts Institute of Technology
2006
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| Online Access: | http://hdl.handle.net/1721.1/32855 |