The effect of probe tilt angle on the quality of scanning tunneling microscope measurements

Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2005. === Includes bibliographical references (p. 39 ). === The effect of probe tilt angle on the quality of Scanning Tunneling Microscopy (STM) measurements was explored. A small but consistent improvement in slo...

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Bibliographic Details
Main Author: Hopkins, Jonathan B. (Jonathan Brigham)
Other Authors: Martin L. Culpepper.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2006
Subjects:
Online Access:http://hdl.handle.net/1721.1/32888