Chemical functionalization of AFM cantilevers

Chemical functionalization of AFM cantilevers

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2005. === Includes bibliographical references (p. 47-52). === Atomic force microscopy (AFM) has been a powerful instrument that provides nanoscale imaging of surface features, mainly of rigid metal or c...

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Bibliographic Details
Main Author: Lee, Sunyoung, S.M. Massachusetts Institute of Technology
Other Authors: Krystyn J. Van Vliet.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2006
Subjects:
Materials Science and Engineering.
Online Access:http://hdl.handle.net/1721.1/34205

Internet

http://hdl.handle.net/1721.1/34205

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