Study of CMOS process variation by multiplexing analog characteristics

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2007. === Includes bibliographical references (p. 149-152). === Aggressive technology scaling raises the need for efficient methods to characterize and model circuit variation at both the fr...

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Bibliographic Details
Main Author: Gettings, Karen Mercedes González-Valentín
Other Authors: Duane S. Boning.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2008
Subjects:
Online Access:http://hdl.handle.net/1721.1/40499