Chu, E. C., & Suresh, S. (2008). Temperature-dependent yield properties of passivated aluminum thin films on silicon wafers. Massachusetts Institute of Technology.
Chicago Style (17th ed.) CitationChu, Edison C., and Subra Suresh. Temperature-dependent Yield Properties of Passivated Aluminum Thin Films on Silicon Wafers. Massachusetts Institute of Technology, 2008.
MLA (8th ed.) CitationChu, Edison C., and Subra Suresh. Temperature-dependent Yield Properties of Passivated Aluminum Thin Films on Silicon Wafers. Massachusetts Institute of Technology, 2008.
Warning: These citations may not always be 100% accurate.