Design and simulation of a rapid high percision profilometer
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1997. === Includes bibliographical references (p. 161-163). === A high precision profilometry system was developed for the quality assurance inspection of twosided samples. Based on system specifications and requi...
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| Format: | Others |
| Language: | English |
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Massachusetts Institute of Technology
2008
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| Online Access: | http://hdl.handle.net/1721.1/43598 |