Hot-carrier reliability assessment in CMOS digital integrated circuits

Hot-carrier reliability assessment in CMOS digital integrated circuits

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998. === Includes bibliographical references. === by Wenjie Jiang. === Ph.D.

Bibliographic Details
Main Author: Jiang, Wenjie, 1963-
Other Authors: James E. Chung.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2009
Subjects:
Electrical Engineering and Computer Science
Online Access:http://hdl.handle.net/1721.1/47514

Internet

http://hdl.handle.net/1721.1/47514

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