Characterization of optical interconnects
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000. === Includes bibliographical references (p. 72-75). === Interconnect has become a major issue in deep sub-micron technology. Even with copper and low-k dielectrics, parasitic effects of...
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| Format: | Others |
| Language: | English |
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Massachusetts Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1721.1/8738 |