Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films
Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2014. === Cataloged from PDF version of thesis. === Includes bibliographical references (pages 81-86). === Porosity is postulated to be one of the reasons for the low efficiency of tin sulfide-based devices. T...
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| Format: | Others |
| Language: | English |
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Massachusetts Institute of Technology
2014
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| Online Access: | http://hdl.handle.net/1721.1/92112 |