Pure-edge dislocation network for strain-relaxed SiGe/Si(001) systems
| Main Authors: | , , , , |
|---|---|
| Language: | en |
| Published: |
American Institute of Physics
2005
|
| Online Access: | http://dx.doi.org/10.1063/1.1943493 http://hdl.handle.net/2237/7015 |