Amplifier design for differential temperature sensors in built-in testing applications
Low-cost radio frequency (RF) communication circuits are frequently fabricated in complementary metal-oxide-semiconductor (CMOS) technology. As system-on-chip and system-in-package designs are becoming increasingly complicated, the manufacturing test cost is continuing to make up a larger portion of...
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| Online Access: | http://hdl.handle.net/2047/d20004850 |