Investigation of oxide semiconductor based thin films : deposition, characterization, functionalization, and electronic applications

Investigation of oxide semiconductor based thin films : deposition, characterization, functionalization, and electronic applications

Nanostructured ZnO films were obtained via thermal oxidation of thin films formed with metallic Zn-nanoparticle dispersions. Commercial zinc nanoparticles used for this work were characterized by microscopic and thermal analysis methods to analyze the Zn-ZnO core shell structure, surface morphology...

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Bibliographic Details
Main Author: Rajachidambaram, Meena Suhanya
Other Authors: Herman, Gregory S.
Language:en_US
Published: 2012
Subjects:
Zinc nanoparticles
Zn-ZnO core shell
Zinc oxide
Zn nanoparticles
Helium ion microscopy
nanostructures
TFT
Zinc tin oxide
ZTO
n-HPA functionalization
n-hexylphosphonic acid
n-HPA
Bias stress stability
sputtered ZTO
sputtered ZTO TFT
functionalization
Semiconductor films
Coating processes
Zinc oxide thin films
Nanostructured materials
Online Access:http://hdl.handle.net/1957/26524

Internet

http://hdl.handle.net/1957/26524

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