Radiation tolerance of magnetic tunnel junctions with MgO barriers
In the next decade, technology trends--smaller dimension, lower voltage, higher operating frequency--introduce new technical considerations and challenges for radiation effects in integrated circuits. Semiconductor based circuits and traditional dynamic random-access memories will malfunction when e...
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| Language: | en_US |
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2012
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| Online Access: | http://hdl.handle.net/1957/31109 |