Just enough die-level functional test : optimizing IC test via machine learning and decision theory
This research explores the hypothesis that methods from decision theory and machine learning can be combined to provide practical solutions to current manufacturing control problems. This hypothesis is explored by developing an integrated approach to solving one manufacturing problem - the optimizat...
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| Language: | en_US |
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2012
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| Online Access: | http://hdl.handle.net/1957/33301 |