Electro-optic characterization of SrS-based alternating current thin-film electroluminescent devices
Two methods of electro-optically characterizing alternating-current thin-film electroluminescent (ACTFEL) devices are investigated: photo-induced transferred charge (PIQ) and luminescence (PIL), and subthreshold voltage-induced transferred charge (VIQ) techniques. Both techniques provide information...
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| Language: | en_US |
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2012
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| Online Access: | http://hdl.handle.net/1957/34180 |