Noise measurements, models and analysis in GaAs MESFETs circuit design

Noise measurements, models and analysis in GaAs MESFETs circuit design

Graduation date: 1996

Bibliographic Details
Main Author: Yan, Kai-tuan Kelvin
Other Authors: Forbes, Leonard
Language:en_US
Published: 2012
Subjects:
Metal semiconductor field-effect transistors > Noise
Electronic circuits > Noise
Online Access:http://hdl.handle.net/1957/34642

Internet

http://hdl.handle.net/1957/34642

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