Noise measurements, models and analysis in GaAs MESFETs circuit design

Noise measurements, models and analysis in GaAs MESFETs circuit design

Graduation date: 1996

Bibliographic Details
Main Author: Yan, Kai-tuan Kelvin
Other Authors: Forbes, Leonard
Language:en_US
Published: 2012
Subjects:
Metal semiconductor field-effect transistors > Noise
Electronic circuits > Noise
Online Access:http://hdl.handle.net/1957/34642
id ndltd-ORGSU-oai-ir.library.oregonstate.edu-1957-34642
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spelling ndltd-ORGSU-oai-ir.library.oregonstate.edu-1957-346422012-10-25T03:12:26ZNoise measurements, models and analysis in GaAs MESFETs circuit designYan, Kai-tuan KelvinMetal semiconductor field-effect transistors -- NoiseElectronic circuits -- NoiseGraduation date: 1996Forbes, Leonard2012-10-24T22:08:08Z2012-10-24T22:08:08Z1996-01-081996-01-08Thesis/Dissertationhttp://hdl.handle.net/1957/34642en_US
collection NDLTD
language en_US
sources NDLTD
topic Metal semiconductor field-effect transistors -- Noise
Electronic circuits -- Noise
spellingShingle Metal semiconductor field-effect transistors -- Noise
Electronic circuits -- Noise
Yan, Kai-tuan Kelvin
Noise measurements, models and analysis in GaAs MESFETs circuit design
description Graduation date: 1996
author2 Forbes, Leonard
author_facet Forbes, Leonard
Yan, Kai-tuan Kelvin
author Yan, Kai-tuan Kelvin
author_sort Yan, Kai-tuan Kelvin
title Noise measurements, models and analysis in GaAs MESFETs circuit design
title_short Noise measurements, models and analysis in GaAs MESFETs circuit design
title_full Noise measurements, models and analysis in GaAs MESFETs circuit design
title_fullStr Noise measurements, models and analysis in GaAs MESFETs circuit design
title_full_unstemmed Noise measurements, models and analysis in GaAs MESFETs circuit design
title_sort noise measurements, models and analysis in gaas mesfets circuit design
publishDate 2012
url http://hdl.handle.net/1957/34642
work_keys_str_mv AT yankaituankelvin noisemeasurementsmodelsandanalysisingaasmesfetscircuitdesign
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