An examination of point defects and atomic diffusion in silicon

The self-interstitial defect is commonly regarded as important in regulating diffusion in silicon. A review of the literature reveals that the scientific bases for invoking the self-interstitial defect are weak, while an alternate defect, the vacancy cluster, has been largely ignored. One argument w...

Full description

Bibliographic Details
Main Author: Monson, Tyrus K.
Other Authors: Van Vechten, James A.
Language:en_US
Published: 2012
Subjects:
Online Access:http://hdl.handle.net/1957/34645