High speed buffers for op-amp characterization
The feasibility of developing test circuits to perform in-circuit testing of analog circuits is investigated in this thesis. A modular approach to analog testing has been adopted. Accordingly, the testing of an operational amplifier, which is a basic building block in analog circuits, is addressed....
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| Language: | en_US |
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2012
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| Online Access: | http://hdl.handle.net/1957/35884 |