Noise Margin, Critical Charge and Power-Delay Tradeoffs for SRAM Design Space Exploration

Noise Margin, Critical Charge and Power-Delay Tradeoffs for SRAM Design Space Exploration

Bibliographic Details
Main Author: Rajendran, Aravind
Language:English
Published: Case Western Reserve University School of Graduate Studies / OhioLINK 2011
Subjects:
Electrical Engineering
SRAM
Stability
Static Noise Margin
Butterfly Curve
Soft Error
Critical Charge
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=case1307667225

Internet

http://rave.ohiolink.edu/etdc/view?acc_num=case1307667225

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