Skip to content
Open Access
  • Home
  • Collections
    • High Impact Articles
    • Jawi Collection
    • Malay Medicine
    • Forensic
  • Search Options
    • UiTM Open Access
    • Search by UiTM Scopus
    • Advanced Search
    • Search by Category
  • Discovery Service
    • Sources
    • UiTM Journals
    • List UiTM Journal in IR
    • Statistic
  • About
    • Open Access
    • Creative Commons Licenses
    • COKI | Malaysia Open Access
    • User Guide
    • Contact Us
    • Search Tips
    • FAQs
Advanced
  • Search
  • Microstructural investigation...
  • Cite this
  • Text this
  • Email this
  • Print
  • Export Record
    • Export to RefWorks
    • Export to EndNoteWeb
    • Export to EndNote
  • Permanent link
Microstructural investigation of defects in epitaxial GaAs grown on mismatched Ge and SiGe/Si substrates

Microstructural investigation of defects in epitaxial GaAs grown on mismatched Ge and SiGe/Si substrates

Bibliographic Details
Main Author: Boeckl, John J.
Language:English
Published: The Ohio State University / OhioLINK 2005
Subjects:
molecular beam epitaxy
MBE
metal organic chemical vapor deposition
MOCVD
electron beam induced current
EBIC
defects
transmission electron microscopy
TEM
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1116498970
  • Holdings
  • Description
  • Similar Items
  • Staff View

Internet

http://rave.ohiolink.edu/etdc/view?acc_num=osu1116498970

Similar Items

  • Electrical and Optical Properties of Au-Catalyzed GaAs Nanowires Grown on Si (111) Substrate by Molecular Beam Epitaxy
    by: Chiu-Yen Wang, et al.
    Published: (2017-04-01)
  • Metal-organic Vapor-Phase Epitaxy Of GaAs On Polar And Nonpolar Substrates
    by: Hudait, Mantu Kumar
    Published: (2012)
  • Development of InGaN quantum dots by the Stranski-Krastanov method and droplet heteroepitaxy
    by: Woodward, Jeffrey
    Published: (2017)
  • A review of molecular beam epitaxy of ferroelectric BaTiO3 films on Si, Ge and GaAs substrates and their applications
    by: Lucie Mazet, et al.
    Published: (2015-06-01)
  • Depth-dependent EBIC microscopy of radial-junction Si micropillar arrays
    by: Kaden M. Powell, et al.
    Published: (2020-09-01)

© 2020 | Services hosted by the Perpustakaan Tun Abdul Razak, | Universiti Teknologi MARA | Disclaimer


Loading...