Linearity and Interference Robustness Improvement Methods for Ultra-Wideband Cmos Rf Front-End Circuits

Linearity and Interference Robustness Improvement Methods for Ultra-Wideband Cmos Rf Front-End Circuits

Bibliographic Details
Main Author: Bu, Long
Language:English
Published: The Ohio State University / OhioLINK 2008
Subjects:
Electrical Engineering
linearity
interference robustness
EERDS
ultra-wideband
RF front-end
LNA
balun
CMOS
band select
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1211476269

Internet

http://rave.ohiolink.edu/etdc/view?acc_num=osu1211476269

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