The Effects of Thermal, Strain, and Neutron Irradiation on Defect Formation in AlGaN/GaN High Electron Mobility Transistors and GaN Schottky Diodes
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Language: | English |
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The Ohio State University / OhioLINK
2013
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Online Access: | http://rave.ohiolink.edu/etdc/view?acc_num=osu1371466261 |