Transmission Electron Microscopy Analysis of Silicon-Doped Beta-Gallium Oxide Films Grown by Pulsed Laser Deposition

Transmission Electron Microscopy Analysis of Silicon-Doped Beta-Gallium Oxide Films Grown by Pulsed Laser Deposition

Bibliographic Details
Main Author: Bowers, Cynthia Thomason
Language:English
Published: Wright State University / OhioLINK 2019
Subjects:
Materials Science
Mechanical Engineering
Transmission electron microscopy
gallium oxide
strain
Si dopant
Focused ion beam milling
scanning electron microscopy
sample preparation
epitaxial
homoepitaxial
native substrate
pulsed laser deposition
power electronic devices
thin films
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=wright1580120635333744

Internet

http://rave.ohiolink.edu/etdc/view?acc_num=wright1580120635333744

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