Fabrication and Characterization of Substrate Materials for Trace Analytical Measurements by Surface Enhanced Raman Scattering (SERS) Spectroscopy Technique

Fabrication and Characterization of Substrate Materials for Trace Analytical Measurements by Surface Enhanced Raman Scattering (SERS) Spectroscopy Technique

Bibliographic Details
Main Author: Vabbilisetty, Pratima
Language:English
Published: Youngstown State University / OhioLINK 2008
Subjects:
Analytical Chemistry
Chemistry
Electromagnetism
Materials Science
SERS
Raman scattering
fabrication and characterization
substrate materials
trace analytical measurements
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=ysu1231794465

Internet

http://rave.ohiolink.edu/etdc/view?acc_num=ysu1231794465

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