Implementation of UART with BIST technique in FPGA
<p> The complexity of the manufacturing process has motivated manufacturers to consider testability as a requirement to assure the reliability and the functionality of each of their designed circuits. One of the most well-known test techniques is called Built-In-Self-Test (BIST). A BIST Univer...
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| Language: | EN |
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California State University, Long Beach
2016
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| Online Access: | http://pqdtopen.proquest.com/#viewpdf?dispub=10111201 |