Quantitative methods for electron energy loss spectroscopy

Quantitative methods for electron energy loss spectroscopy

This thesis explores the analytical capabilities of low-loss electron energy loss spectroscopy (EELS), applied to disentangle the intimate configuration of advanced semiconductor heterostructures. Modern aberration corrected scanning transmission electron microscopy (STEM) allows extracting spectros...

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Bibliographic Details
Main Author: Eljarrat Ascunce, Alberto
Other Authors: Peiró Martínez, Francisca
Format: Doctoral Thesis
Language:English
Published: Universitat de Barcelona 2015
Subjects:
Ciències Experimentals i Matemàtiques
53 - Física
Online Access:http://hdl.handle.net/10803/349214

Internet

http://hdl.handle.net/10803/349214

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