Reliability in the face of variability in nanometer embedded memories
In this thesis, we have investigated the impact of parametric variations on the behaviour of one performance-critical processor structure - embedded memories. As variations manifest as a spread in power and performance, as a first step, we propose a novel modeling methodology that helps evaluate the...
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| Format: | Doctoral Thesis |
| Language: | English |
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Universitat Politècnica de Catalunya
2014
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| Online Access: | http://hdl.handle.net/10803/144560 |