Low-cost and efficient fault detection and diagnosis schemes for modern cores
Continuous improvements in transistor scaling together with microarchitectural advances have made possible the widespread adoption of high-performance processors across all market segments. However, the growing reliability threats induced by technology scaling and by the complexity of designs are ch...
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| Format: | Doctoral Thesis |
| Language: | English |
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Universitat Politècnica de Catalunya
2015
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| Online Access: | http://hdl.handle.net/10803/323899 |