Layout regularity for design and manufacturability

In nowadays nanometer technology nodes, the semiconductor industry has to deal with the new challenges associated to technology scaling. On one hand, process developers face increasing manufacturing cost and variability, but also decreasing manufacturing yield. On the other hand, circuit designers a...

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Bibliographic Details
Main Author: Pons Solé, Marc
Other Authors: Abella Ferrer, Jaume
Format: Doctoral Thesis
Language:English
Published: Universitat Politècnica de Catalunya 2012
Subjects:
621
Online Access:http://hdl.handle.net/10803/96983