Contact Detection for Nanomanipulation in Scanning Electron Microscope
A major difficulty in the fabrication of nanostructure based electronics is the lack of effective processes capable of precisely arranging nanostructures into predefined positions. Top-down approaches introduce increased complexity and a high cost for practical industrial use, while bottom-up approa...
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| Language: | en_ca |
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2011
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| Online Access: | http://hdl.handle.net/1807/31619 |