Redundancy-aware Electromigration Checking for Mesh Power Grids
Electromigration is re-emerging as a significant problem in modern integrated circuits (IC). Especially in power-grids, due to shrinking wire widths and increasing current densities, there is little or no margin left between the predicted EM stress and that allowed by the EM design rules. Statistica...
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| Language: | en_ca |
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2013
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| Online Access: | http://hdl.handle.net/1807/42716 |