A probabilistic testability measure model and program for digital circuits

碩士 === 國立交通大學 === 電子研究所 === 75 ===

Bibliographic Details
Main Authors: HUANG, WEI-BIN, 黃渭濱
Other Authors: LI, CHONG-REN
Format: Others
Language:zh-TW
Published: 1987
Online Access:http://ndltd.ncl.edu.tw/handle/17179802476464541820