Testability analyzer and test pattern generator of digital circuits

碩士 === 國立臺灣大學 === 電機工程研究所 === 75 ===

Bibliographic Details
Main Authors: XU, JUN-JIE, 徐俊傑
Other Authors: LIN, CHENG-XIANG
Format: Others
Language:zh-TW
Published: 1987
Online Access:http://ndltd.ncl.edu.tw/handle/05487583463746358548