Testability measure for delay fault in digital circuits

碩士 === 國立交通大學 === 電子研究所 === 78 ===

Bibliographic Details
Main Authors: WU,WEN-QING, 吳文慶
Other Authors: LI,CHONG-REN
Format: Others
Language:zh-TW
Published: 1990
Online Access:http://ndltd.ncl.edu.tw/handle/32455918706555307761