Testability measure for delay fault in digital circuits

Testability measure for delay fault in digital circuits

碩士 === 國立交通大學 === 電子研究所 === 78 ===

Bibliographic Details
Main Authors: WU,WEN-QING, 吳文慶
Other Authors: LI,CHONG-REN
Format: Others
Language:zh-TW
Published: 1990
Online Access:http://ndltd.ncl.edu.tw/handle/32455918706555307761
id ndltd-TW-078NCTU2430080
record_format oai_dc
spelling ndltd-TW-078NCTU24300802015-10-13T15:21:05Z http://ndltd.ncl.edu.tw/handle/32455918706555307761 Testability measure for delay fault in digital circuits 數位電路中延遲故障之可測試性度量 WU,WEN-QING 吳文慶 碩士 國立交通大學 電子研究所 78 LI,CHONG-REN 李崇仁 1990 學位論文 ; thesis 65 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立交通大學 === 電子研究所 === 78 ===
author2 LI,CHONG-REN
author_facet LI,CHONG-REN
WU,WEN-QING
吳文慶
author WU,WEN-QING
吳文慶
spellingShingle WU,WEN-QING
吳文慶
Testability measure for delay fault in digital circuits
author_sort WU,WEN-QING
title Testability measure for delay fault in digital circuits
title_short Testability measure for delay fault in digital circuits
title_full Testability measure for delay fault in digital circuits
title_fullStr Testability measure for delay fault in digital circuits
title_full_unstemmed Testability measure for delay fault in digital circuits
title_sort testability measure for delay fault in digital circuits
publishDate 1990
url http://ndltd.ncl.edu.tw/handle/32455918706555307761
work_keys_str_mv AT wuwenqing testabilitymeasurefordelayfaultindigitalcircuits
AT wúwénqìng testabilitymeasurefordelayfaultindigitalcircuits
AT wuwenqing shùwèidiànlùzhōngyánchígùzhàngzhīkěcèshìxìngdùliàng
AT wúwénqìng shùwèidiànlùzhōngyánchígùzhàngzhīkěcèshìxìngdùliàng
_version_ 1717764314944765952

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