Testability measure for delay fault in digital circuits
碩士 === 國立交通大學 === 電子研究所 === 78 ===
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ndltd-TW-078NCTU24300802015-10-13T15:21:05Z http://ndltd.ncl.edu.tw/handle/32455918706555307761 Testability measure for delay fault in digital circuits 數位電路中延遲故障之可測試性度量 WU,WEN-QING 吳文慶 碩士 國立交通大學 電子研究所 78 LI,CHONG-REN 李崇仁 1990 學位論文 ; thesis 65 zh-TW |
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NDLTD |
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zh-TW |
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Others
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description |
碩士 === 國立交通大學 === 電子研究所 === 78 ===
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author2 |
LI,CHONG-REN |
author_facet |
LI,CHONG-REN WU,WEN-QING 吳文慶 |
author |
WU,WEN-QING 吳文慶 |
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WU,WEN-QING 吳文慶 Testability measure for delay fault in digital circuits |
author_sort |
WU,WEN-QING |
title |
Testability measure for delay fault in digital circuits |
title_short |
Testability measure for delay fault in digital circuits |
title_full |
Testability measure for delay fault in digital circuits |
title_fullStr |
Testability measure for delay fault in digital circuits |
title_full_unstemmed |
Testability measure for delay fault in digital circuits |
title_sort |
testability measure for delay fault in digital circuits |
publishDate |
1990 |
url |
http://ndltd.ncl.edu.tw/handle/32455918706555307761 |
work_keys_str_mv |
AT wuwenqing testabilitymeasurefordelayfaultindigitalcircuits AT wúwénqìng testabilitymeasurefordelayfaultindigitalcircuits AT wuwenqing shùwèidiànlùzhōngyánchígùzhàngzhīkěcèshìxìngdùliàng AT wúwénqìng shùwèidiànlùzhōngyánchígùzhàngzhīkěcèshìxìngdùliàng |
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1717764314944765952 |