Transient simulation and modeling of the hot-electron effect in MOSFET under AC stress

碩士 === 國立交通大學 === 電子研究所 === 78 ===

Bibliographic Details
Main Authors: Xu, Bo-Qin, 許博欽
Other Authors: Zhuang, Shao-Xun
Format: Others
Language:zh-TW
Published: 1991
Online Access:http://ndltd.ncl.edu.tw/handle/62183778345870837069