Effects of BF2 + -implanted polysilicon and molybdenum polycide gate structures on the reliability of gate oxides

碩士 === 國立交通大學 === 應用化學研究所 === 79 ===

Bibliographic Details
Main Authors: LIN,SHAG-MEI, 林上玫
Other Authors: ZHENG,HUANG-ZHONG
Format: Others
Language:zh-TW
Published: 1991
Online Access:http://ndltd.ncl.edu.tw/handle/42076756485255950063