Back gate bias effect on the subthreshold behavior and the switching performance in an ultra-thin SOI CMOS inverter operating at 77K

碩士 === 國立臺灣大學 === 電機工程研究所 === 80 ===

Bibliographic Details
Main Authors: LI, WEI-JUN, 李偉儁
Other Authors: GUO, ZHENG-BANG
Format: Others
Language:en_US
Published: 1992
Online Access:http://ndltd.ncl.edu.tw/handle/34440469791188608296