Test pattern generation and partial scan design for sequential circuits
博士 === 國立成功大學 === 電機工程研究所 === 81 ===
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
1993
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| Online Access: | http://ndltd.ncl.edu.tw/handle/59715564657336398614 |