CHARACTERISTICS AND APPLICATIONS OF NEW SILOXANE SOG IN SUBMICRON PLANARIZATION TECHNOLOGY

碩士 === 國立交通大學 === 材料科學(工程)研究所 === 81 === When the line width of VLSI backend processes reduces to sub- half micron regime, a new siloxane-type SOG is demanded. In this work, AS314 from Allied Signal Inc. was investigated. Material character...

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Bibliographic Details
Main Authors: Chung-Song Wu, 吳宗松
Other Authors: Edward Y. Chang
Format: Others
Language:en_US
Published: 1993
Online Access:http://ndltd.ncl.edu.tw/handle/86137133415895030039