Wafer Scale Defect-Tolerant Memory System Design

碩士 === 國立交通大學 === 資訊工程研究所 === 81 === Wafer Scale Integration (WSI) has many potential advantages such as low power consumption, small volume, low system cost, etc . Nevertheless its feasibility has been investigated for a long time. In t...

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Bibliographic Details
Main Authors: Liu Ann-Chi, 劉安琦
Other Authors: Chang Ming-Feng
Format: Others
Language:en_US
Published: 1993
Online Access:http://ndltd.ncl.edu.tw/handle/12988455979522131349