Test Sequence Generation for testing EFSM Transitions with Fault Functions
碩士 === 國立交通大學 === 資訊工程研究所 === 82 === Test sequences have been successfully used for testing the correctness of an Implementation Under Test(IUT) based on an Finite State Machine (FSM). However, FSMs have been shown to be unable to specify r...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | en_US |
Published: |
1994
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Online Access: | http://ndltd.ncl.edu.tw/handle/59748001733092001915 |