THE TEST GENERATION AND COMPACTION FOR MULTIPLE FAULT MODELS IN COMBINATIONAL CIRCUITS

碩士 === 國立中興大學 === 資訊科學研究所 === 83 ===

Bibliographic Details
Main Authors: Xu, Zhi-Ming, 許志銘
Other Authors: Wang, Xing-Jian
Format: Others
Language:zh-TW
Published: 1995
Online Access:http://ndltd.ncl.edu.tw/handle/42581379406365005345