Study of polycrystalline silicon thin film transistors

碩士 === 國立交通大學 === 應用化學系 === 83 === The solid pases recrystallization of amorphous silicon ( α-Si ) films deposited by a low-pressure chemical vapor deposition system using disilane (Si2H6) gas at various annealing conditions are investigate...

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Bibliographic Details
Main Authors: Wen-Hung Lien, 連文宏
Other Authors: Huang-Chung Cheng
Format: Others
Language:en_US
Published: 1995
Online Access:http://ndltd.ncl.edu.tw/handle/57694513232941617495