The prediction on the Ellipsometric measurement of an uniaxial medium
碩士 === 國立交通大學 === 光電工程研究所 === 84 === Ellipsometry has been recognized in recent years as powerful and versatile diagnostics tool for material surface studies. It has been used by variousdisciplines of sciences and engineering in a wide...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1996
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| Online Access: | http://ndltd.ncl.edu.tw/handle/73272561348011576161 |