The prediction on the Ellipsometric measurement of an uniaxial medium
碩士 === 國立交通大學 === 光電工程研究所 === 84 === Ellipsometry has been recognized in recent years as powerful and versatile diagnostics tool for material surface studies. It has been used by variousdisciplines of sciences and engineering in a wide...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1996
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| Online Access: | http://ndltd.ncl.edu.tw/handle/73272561348011576161 |
| Summary: | 碩士 === 國立交通大學 === 光電工程研究所 === 84 === Ellipsometry has been recognized in recent years as powerful
and versatile diagnostics tool for material surface studies. It
has been used by variousdisciplines of sciences and engineering
in a wide varity of applications. Inthis thesis we use
ellipsometric theory to determine the optical properties of
isotropic and anisotrpic media. We improve the program provided
by NDL. The program can determine the optical constants ( such
as complex refractive index,film thickness ) of isotropic media
under monochromatic incident light at fixedincident angle
condition. We expand the program into spectroscopic
ellipsometryand multiple angle of incidence case. Another
program calculates the ellipsometric parameters of anisotropic
media. We dicuss the dependence of the ellipsometric parameters
as a function of azimuthal angle of optical axis. We also show
the ellipsometric parametersis very sensitive to the magnitude
of the dielectric tensor and the orentationof optical axis to
the sample surface.
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