A Comprehensive Study of Low Voltage Triggering SCR ESD Protection Structures
碩士 === 國立交通大學 === 電子研究所 === 84 === The thesis presents for the first time a comprehensive study of lowvoltage triggering SCR (Silicon-Controlled Rectifier) ESD (Electro-StaticDischarge) protection structures in a CMOS process. This merg...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
1996
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Online Access: | http://ndltd.ncl.edu.tw/handle/58291238209126672766 |