A Comprehensive Study of Low Voltage Triggering SCR ESD Protection Structures

碩士 === 國立交通大學 === 電子研究所 === 84 === The thesis presents for the first time a comprehensive study of lowvoltage triggering SCR (Silicon-Controlled Rectifier) ESD (Electro-StaticDischarge) protection structures in a CMOS process. This merg...

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Bibliographic Details
Main Authors: Chen, Mainn-Gow, 陳面國
Other Authors: Ming-Jer Chen
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/58291238209126672766