Basic Characteristics and Selective Deposition of Cu CVD

碩士 === 國立交通大學 === 電子研究所 === 84 === Copper has an excellent electrical conductivity as well as electromigrationresistance. It has been regarded as a potential conductor material to replacethe aluminum based interconnect system for the fut...

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Bibliographic Details
Main Authors: Hwang, Sho-Wei, 黃守偉
Other Authors: Mao-Chieh Chen
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/81968417351363828398