Mobility Parameters Extraction of SOI MOSFET and Self-Heating Study

碩士 === 國立中山大學 === 電機工程研究所 === 84 === We extract mobility parameters of SOI MOSFET base on Lombardi mobility model. In the first step, we define the buried oxide interface charge with a simple process and get parameters by optimal method. In...

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Bibliographic Details
Main Authors: Huang,Sheng Kuo, 黃勝國
Other Authors: Kao,Chia Hsiung
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/49566889246881820099